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Automatic optical inspection system & method (1)

建立日期:2018/02/21
  • 作者: Orbotech
  • 出處: USPTO-美國專利商標局
  • 內容: 本篇內容為Orbotech於April 10, 2007 獲證之美國專利,下文為專利摘要,專利全文請連結參考網址,瀏覽專利全文所需看圖軟體請至 http://www.alternatiff.com/ 下載。

    Orbotech在此主題上獲證4篇專利,將一一介紹。

    A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.