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Electrical circuit conductor inspection (1)

建立日期：2018/02/21
  • 作者： Orbotech
  • 出處： USPTO-美國專利商標局
  • 內容： "本篇內容為Orbotech於March 22, 2005 獲證之美國專利。在此發明之後，Orbotech後續有提出改良，並於February 28, 2006 獲得另一項專利，將於第二篇中介紹。

    下文為專利摘要，專利全文請連結參考網址，瀏覽專利全文所需看圖軟體請至 http://www.alternatiff.com/ 下載。"

    A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attribute information and second attribute information is analyzed to determine an inspection attribute of the conductor at the conductor location. Attribute information may relate to one or more of: reflectance, fluorescence or height.
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