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Optical spectrum analyzer

建立日期：2018/02/21
  • 作者： Anritsu
  • 出處： USPTO-美國專利商標局
  • 內容： 本篇內容為Anritsu於April 29, 2008 獲證之美國專利，下文為專利摘要，專利全文請連結參考網址，瀏覽專利全文所需看圖軟體請至 http://www.alternatiff.com/ 下載。

    [Abstract]
    An optical spectrum analyzer measures to-be-measured light while carrying out calibration processing for correcting wavelength information of spectrum data of the to-be-measured light by a wavelength information correction device through a storage device based on the spectrum data of reference light that is obtained by causing the reference light whose wavelength is known to be incident on a tunable wavelength filter from light incident devices at all times together with the to-be-measured light. Since the optical spectrum analyzer can continuously measure the to-be-measured light in a wide wavelength range at high speed while maintaining high wavelength accuracy, it can continuously obtain the spectrum data of the to-be-measured light with high wavelength accuracy even if it is installed in a place in which an environment intensely changes.

    [FIELD OF THE INVENTION]
    The present invention relates to an optical spectrum analyzer, and more particularly, to an optical spectrum analyzer that employs a technology for improving wavelength accuracy of spectrum characteristics of light when the spectrum characteristics are determined by using a tunable wavelength filter.
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