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Method of generating image and illumination device for inspecting substrate

建立日期：2018/02/21
  • 作者： Omron
  • 出處： USPTO-美國專利商標局
  • 內容： 本篇內容為Omron於July 1, 2008 獲證之美國專利，下文為專利摘要，專利全文請連結參考網址，瀏覽專利全文所需看圖軟體請至 http://www.alternatiff.com/ 下載。

    [Abstract]
    For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specified angular range with respect to a target area on the substrate. The camera is operated to generate an image of the target area for inspection while switched-on conditions of these light emitting members are being controlled such that the colors and angles of light illuminating this target area are varied according to a specified kind of the purpose of this inspection.

    [FIELD OF THE INVENTION]
    This invention relates to the production of a substrate having components mounted thereto and more particularly to the technology of carrying out an inspection by image processing, either during or after a production process therefor, of the lands, the soldered parts and the mounted components on the substrate that is being produced or has been produced.
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