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全場全值域量測雙折射材料之主軸角度及相位延遲量

建立日期：2018/02/21
  • 作者： 羅裕龍
  • 出處： 成功大學機械所 羅裕龍教授
  • 內容： Two novel heterodyne interferometers designed for measuring the principal axis and phase retardation of the linear birefringent materials in full-field are proposed. By using a complex programmable logic device (CPLD) and a charge-coupled device (CCD), integrating buckets with multiple frames are achieved. We can achieve to measure the principal axis and phase retardation in full field simultaneously, but the dynamic range of phase retardation measurement is only up to 90°. The second system is designed to achieve the full-scale and full-field measurement by sequentially measurement.
  • 檔案下載：全場全值域量測雙折射材料之主軸角度及相位延遲量
  • 下載次數：240
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