top

知識分享

Birefringence Measurements by a Zeeman Laser and a New Scheme

建立日期：2018/02/12
  • 作者： 林俊鋒等
  • 出處： 遠東科技大學電腦應用工程系 林俊鋒，成功大學機械系 羅裕龍
  • 內容： This paper presents a new optical configuration for measuring the principal axis angle and phase retardation of optical linear birefringent materials. A heterodyne light source, which is generated by a Zeeman laser, and a new scheme measure the principal axis angle and phase retardation. The measurement system has advantages as a simple optical setup, high stability, small size, and portable owing to the use of a Zeeman laser and the configuration. Using the amplitudes from two measured heterodyne signals and a referenced heterodyne signal, a simple derived algorithm can obtain the principal axis angle and phase retardation directly and easily. According to the algorithm, the principal axis angle is limited in the range from 00 to 900 while the phase retardation in the range from 00 to 1800 is available. Moreover, we can extend
    dynamic range of the phase retardation measurement to be 1800 successfully. According to the experimental results, the average absolute errors for the principal axis angle and the phase retardation of λ / 4 -wave plate with principal axis angle set on 900 are determined to be 1.470 and 2.9 % respectively. The error for the phase retardation is within uncertainty range 5 % or more of commercial quarter-wave plates.
  • 檔案下載：Birefringence Measurements by a Zeeman Laser and a
  • 下載次數：377
回上頁