技術專欄 - 知識分享 - AOIEA 自動光學檢測設備聯盟

建立日期：2018/02/09

作者： G. Dyankov等
出處： 工研院量測中心 G. Dyankov, Chih-Shang Liu, Kai-Ping Chuang
內容： Optically anisotropic thin films like polarizer and compensator are crucial elements in optical scheme of LCD. Improving brightness and contrast, color and gamut, off axis viewing and uniformity of LCD relates with improving the quality of compensator and polarizer. Market demands on every year cut cost impose the requirement for tight quality control during the manufacturing. The methods providing control have to meet few requirements: accuracy, high rate of measurement synchronized with the speed of role–to-role technology, high spatial resolution.This paper comments optical properties of thin film compensator measured by the spectral method.It is shown that the spectral analysis of the light reflected at compensating side provides correct measurement.To meet the requirements of measurement a modification of the method is proposed. It is shown that the modified method gives information for the refractive index and thickens and extends sufficiently the application. Modified and unmodified methods are compared in requirements they impose about accuracy of measurement and algorithms for modeling of date.

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檔案下載：Optical properties of multilayer optical compensat
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