技術詳情
首頁 > 技術鏈結 > (單一粒子)感應耦合電漿質譜量測技術感應耦合電漿質譜法 (ICP-MS) 結合高溫電漿離子化與質譜偵測，具備高靈敏度與多元素分析能力，可量測微量及超微量元素；延伸之單一粒子分析技術 (spICP-MS) 透過時間解析量測，偵測個別奈米粒子的瞬時離子脈衝訊號。本系統隸屬於國家度量衡標準實驗室 (NML) D27 奈米粒子功能性量測系統，結合粒子計數、傳輸效率及進樣流率等參數，提供金奈米粒子數量濃度量測與校正服務，並延伸開發其他無機奈米粒子的量測技術。
Inductively coupled plasma mass spectrometry (ICP-MS) combines high-temperature plasma ionization with mass spectrometric detection for highly sensitive multi-element analysis at trace and ultratrace levels. Single-particle ICP-MS (spICP-MS) extends this capability through time-resolved detection of transient ion pulses from individual nanoparticles. As part of the National Measurement Laboratory (NML) D27 Nanoparticle Functional Property Measurement System, this system combines particle counting, transport efficiency, and sample uptake rate to provide gold nanoparticle number concentration measurement and calibration services, while supporting the development of measurement methods for other inorganic nanoparticles.
- Brand / Model: Agilent / 8900 ICP-MS/MS
- ICP-MS routine analysis sensitivity
- Low-mass elements — ⁷Li or ⁹Be: ≥ 200 Mcps/ppm
- Mid-mass elements — ⁸⁹Y or ¹¹⁵In: ≥ 1,200 Mcps/ppm
- High-mass elements — ²⁰⁵Tl or ²³²Th: ≥ 450 Mcps/ppm
- Fe sensitivity: > 2,000 cps/ppt (spICP-MS capability: Detection and particle size distribution analysis of 30 nm iron oxide nanoparticles.)
- NML D27 Calibration Capabilities
- Calibration service: Gold nanoparticle number concentration
- Applicable particle size range: 15 – 100 nm (Gold nanoparticles)
- Particle number concentration range: 5.00 × 10³ – 2.00 × 10¹² particles/g
- Relative expanded uncertainty, Ur: 15% (approximately 95% confidence level)
- 微量及超微量元素分析
Trace and ultratrace element analysis - 金奈米粒子顆粒濃度校正
Gold nanoparticle number concentration calibration - 其他無機奈米粒子量測技術開發
Measurement method development for other inorganic nanoparticles
