技術簡介
Technology Description

微分電移動度分析儀搭配凝結粒子計數器(DMA-CPC)是一種奈米氣膠粒子量測技術。DMA依粒子的電遷移率進行粒徑分級,再由CPC將奈米粒子經蒸氣凝結放大後逐顆計數。此技術可量測奈米粒子的粒徑分布與數目濃度,適用於氣膠及經霧化處理之半導體化學品奈米粒子與微量不純物分析。
Differential Mobility Analyzer–Condensation Particle Counter (DMA-CPC) is a nanoparticle measurement technique. The DMA classifies charged particles according to their electrical mobility, while the CPC enlarges nanoparticles through vapor condensation for individual particle counting. This technique provides particle size distribution and number concentration and can be applied to aerosols and aerosolized semiconductor chemical samples for nanoparticle and trace impurity characterization.

技術規格
Specifications
  • Particle Size Range: 1 nm ~ 1000 nm
  • Aerosol Flow Rate: 0.2 L/min ~ 2.5 L/min
  • Sheath Flow Rate: 2 L/min ~25 L/min
  • Particle Concentration Range: < 3 × 10⁵ particles/cm³
  • Particle Size Accuracy: ± 3%
  • Particle Concentration Accuracy: ±10%
DMA-CPC measurement system
DMA-CPC measurement system
應用範圍
Applications
  1. 粒子粒徑量測
    Particle size measurement
  2. 粒子濃度量測
    Particle concentration measurement
  3. 半導體製程化學品量測
    Chemical measurement in semiconductor processes
Differential Mobility Analyzer
Differential Mobility Analyzer
Nanoparticle size distribution
Nanoparticle size distribution
Nanoparticle and impurities analysis
Nanoparticle and impurities analysis