Micro LED大型拼接顯示器快速量測技術

Micro LED大型拼接顯示器由多個顯示模組組成，亮度、色度與畫面均勻性若存在差異，容易在拼接區域形成可視化不均，影響整體顯示品質。傳統逐點量測需耗費大量時間，難以配合大型顯示器及產線檢測需求。

本技術以二維影像式量測為基礎，透過畫素尺寸、收光角度與量測距離的最佳化匹配，使單次取像涵蓋整體顯示畫面，並同步取得亮度（Luminance）與色度（Chromaticity）分布。搭配鏡頭畸變與亮度均勻性校正，可縮短量測時間並提升全視場量測一致性，支援大型拼接顯示器的快速檢測與品質監控。

Large tiled Micro LED displays consist of multiple display modules. Discrepancies in luminance, chromaticity, and screen uniformity across tiled boundaries can cause visible seam artifacts and degrade display quality. Traditional point-by-point metrology is time-consuming and inadequate for large screens and in-line inspection.

This technology utilizes 2D imaging metrology with optimized matching of pixel size, collection angle, and working distance. A single shot captures the entire display area while simultaneously acquiring luminance and chromaticity distributions. Coupled with lens distortion and luminance uniformity corrections, it significantly shortens measurement time and enhances field uniformity, supporting rapid in-line inspection and quality monitoring.