VCSEL檢測驗證技術

VCSEL具小型化、高輸出、近紅外波段與脈衝驅動等特性，應用市場持續擴大。VCSEL光形具有明顯的空間分布特性，若量測幾何、收光方式與演算法不同，容易造成測試結果差異，影響產品研發與規格驗證。

本技術建立VCSEL快速光形量測模組、輻射強度分布演算法與輻射通量追溯標準。利用相機取得二維光形E(x,y)，轉換為角度分布I(θ,φ)，再計算輻射通量Φ，並以標準件驗證量測結果。支援800 nm to 1700 nm與20 mW to 10 W量測範圍，提升產業量測一致性。

VCSELs feature compact footprints, high power output, near-infrared operation, and pulse-driven capabilities, driving market expansion. VCSEL beam profiles exhibit distinct spatial distribution characteristics; variations in measurement geometry, light collection, and algorithms can lead to divergent test results, affecting product R&D and validation.

This technology establishes a rapid VCSEL beam profiling module, radiant intensity distribution algorithms, and radiant flux traceability standards. Using a camera-based system to capture 2D beam profiles E(x,y), convert them into angular distributions I(θ,φ), and compute total radiant flux Φ with standard reference verification. Supporting 800 nm to 1700 nm and 20 mW to 10 W ranges to enhance measurement consistency.