技術詳情
首頁 > 技術鏈結 > 150 GHz 矽光子元件頻率響應分析儀目前市面上以光網儀量測光電元件頻寬,不易將高頻訊號或電光調制器提升到 200 GHz 以上。本產品利用微波光子技術產生高頻訊號,搭配寬頻量測模組完成整機,利用雷射波長易於調整的特性,量測頻率可達 156 GHz,未來可提升到 >200 GHz。
Current market solutions using optical network analyzers to measure the bandwidth of optoelectronic components struggle to push high-frequency signals or electro-optic modulators beyond 200 GHz. This product utilizes microwave photonics technology to generate high-frequency signals and integrates a broadband measurement module into a complete system; by leveraging the tunability of laser wavelengths, it achieves measurement frequencies of up to 156 GHz, with the potential to exceed 200 GHz in the future.
- 量測功能:光電元件頻率響應分析
- 頻率範圍:DC ~ 156 GHz (未來可提升至 > 200 GHz)
- 頻率解析度:1 GHz
- 取樣率:2 samples/s
- 雷射操作波長:1550 nm & 1310 nm
- 系統動態範圍:≧ 50 dB @ 100 GHz
- 底部雜訊:≦ -35 dBm/Hz @ 100 GHz
- 高速矽光子元件測試:直調雷射 (Directly modulated laser)
- 電光調制器測試 (Electro-optic modulator, EOM)
- 高速光偵測器測試 (Photodetector, PD)
- 高頻半導體元件、傳輸線與微波接頭測試