技術簡介
Technology Description

目前市面上以光網儀量測光電元件頻寬,不易將高頻訊號或電光調制器提升到 200 GHz 以上。本產品利用微波光子技術產生高頻訊號,搭配寬頻量測模組完成整機,利用雷射波長易於調整的特性,量測頻率可達 156 GHz,未來可提升到 >200 GHz。

Current market solutions using optical network analyzers to measure the bandwidth of optoelectronic components struggle to push high-frequency signals or electro-optic modulators beyond 200 GHz. This product utilizes microwave photonics technology to generate high-frequency signals and integrates a broadband measurement module into a complete system; by leveraging the tunability of laser wavelengths, it achieves measurement frequencies of up to 156 GHz, with the potential to exceed 200 GHz in the future.

技術規格
Specifications
  • 量測功能:光電元件頻率響應分析
  • 頻率範圍:DC ~ 156 GHz (未來可提升至 > 200 GHz)
  • 頻率解析度:1 GHz
  • 取樣率:2 samples/s
  • 雷射操作波長:1550 nm & 1310 nm
  • 系統動態範圍:≧ 50 dB @ 100 GHz
  • 底部雜訊:≦ -35 dBm/Hz @ 100 GHz
silicon_photonics_analyzer
應用範圍
Applications
  1. 高速矽光子元件測試:直調雷射 (Directly modulated laser)
  2. 電光調制器測試 (Electro-optic modulator, EOM)
  3. 高速光偵測器測試 (Photodetector, PD)
  4. 高頻半導體元件、傳輸線與微波接頭測試
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